The purpose of this course is to give the minimum of theoretical and practical knowledge which is required in order to take the best advantage of the various techniques applied to investigation of the structure of different materials. In this connection the application of XRD, neutronography, electronography, UV-VIS spectroscopy, IR-spectroscopy, ESR, NMR, Mossbauer spectroscopy, XPS, AES and SIMS is considered. The main topics of this course are:
graphical and digital presentation of the primary structural information from the corresponding method;
determination of the main parameters which are responsible after recording of the information;
convert and analysis of the primary information into structural data for different materials such as metals, polymers, glasses, ceramics, semiconductors.
